Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.
October 26, 2012. Aegis Software announced that Sechan Electronics Inc., a contract manufacturing services company, chose Aegis’ Quality System as a replacement for Sechan's paper-based defect mapping ...
Researchers used AI-guided electron microscopy to map atomic-level point defects in 3D within ultrathin MXene layers, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results